Congress

Congress

Author/sN. Seoane, M. Aldegunde, K. Kalna and A. J. Garcia-Loureiro
DOI10.1109/SISPAD.2014.6931611
Source2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Mielparque Yokohama, Yokohama 2014

High performance computing
Language technologies

MC/DD Study of Metal Grain Induced Current Variability in a Nanoscale InGaAs FinFET

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Publication: Congress

1624015031459

June 18, 2021

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- N. Seoane, M. Aldegunde, K. Kalna and A. J. Garcia-Loureiro - 10.1109/SISPAD.2014.6931611

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