Multi-Subband Interface Roughness Scattering using 3D Finite Element Monte Carlo with 2D Schodinger Equation for Simulations of sub-16nm FinFETs

Publication: Congress

1624015038523

June 18, 2021

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- Daniel Nagy, Muhammad A. Elmessary, Manuel Aldegunde, Jari Lindberg, Antonio J. Garcia-Loureiro and Karol Kalna - 10.1109/IWCE.2015.7301977

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