Multi-Subband Interface Roughness Scattering using 2D Finite Element Schodinger Equation for Monte Carlo Simulations of Multi-Gate Transistors

Publication: Congress

1624015039199

June 18, 2021

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- Daniel Nagy, Muhammad A. Elmessary, Manuel Aldegunde, Jari Lindberg4, Antonio J. Garcıa-Loureiro and Karol Kalna - 10.1109/IWCE.2015.7301977

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