Publications

An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs

A machine learning approach to model the impact of line edge roughness on gate-all-around nanowire FETs while reducing the carbon footprint

An accurate neural network model to study threshold voltage variability due to metal grain granularity in Nanosheet FETs

Estudio y optimización de herramientas numéricas para simulación de dispositivos semiconductores

A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET

Pseudo-Passive Time-of-Flight Imaging: Simultaneous Illumination, Communication, and 3D Sensing

Pelgrom-based predictive model to estimate metal grain granularity and line edge roughness in advanced multigate MOSFETs

Fast Time-Domain Super-Resolution for Single-Shot Multi-Path ToF Imaging

Providing female role models in STEM higher education careers, a teaching experience

A comprehensive Pelgrom-based on-current variability model for FinFET, NWFET and NSFET

Low-cost mobile mapping system solution for traffic sign segmentation using Azure Kinect

Perspectiva de género en Inteligencia Artificial, una necesidad

Ultra-low power CMOS circuit design for energy harvesting applications

Design of a 5-bit SRAM-based In-Memory Computing Cell for Deep Learning Models

A 2-Tap Macro-Pixel-Based Indirect ToF CMOS Image Sensor for Multi-Frequency Demodulation

Proposal of a Single-Shot Multi-Frame Multi-Frequency CMOS ToF Sensor

Impact of metal grain granularity on three gate-all-around advanced architectures

Simulations of Statistical Variability in n-Type FinFET, Nanowire, and Nanosheet FETs

Semiconductor devices variability: modelling, characterization and data management

Threshold voltage variability study in a 12 nm gate length Nanosheet FET